UNIQUE -55°...+250°C MEDIUM FREE TEMPERATURE FORCING

Compact & Portable Design Fast Thermal Cycling Ultra Quiet Operation 40dBA Power Consumption < 600 W

UNIQUE -55°...+250°C MEDIUM FREE TEMPERATURE FORCING

UNIQUE SCALABLE SOC TEST SOLUTION

Ultra compact, multi site, wafer and final test, 10GBit data transfer rate, smallest ATE module form factor, VHDL programming …

UNIQUE SCALABLE SOC TEST SOLUTION
UNIQUE BOARD REPAIR & DIAGNOSTIC TEST SOLUTION

UNIQUE BOARD REPAIR & DIAGNOSTIC TEST SOLUTION

Digital/analog/mixed signal, VHDL device library, guided Probe back-tracking, QSM-VI signature analysis, automatic fault simulation, circuit tracer …

UNIQUE HIGH POWER TEST SOLUTION

Static and dynamic wafer and final test, 10,000 V and 10,000 A ...

UNIQUE HIGH POWER TEST SOLUTION

ACCESSORIES PRODUCTS

Unique PXI instruments, 19" VISM modules, 2D high end image processing for Zero Defect industrial applications

ACCESSORIES PRODUCTS

News & Highlights

  • Semicon Europe 2012

    October 9-11, 2012 in Dresden

  • Press Release

    Modular, extremely compact and optimally scalable semiconductor tester platform
    features economical high-speed verifications in production, design, R&D and lab

Testimonials
Testimonials

What others have to say about us

CitationInstant sales coverage on target markets with strong customer relationship, network and background of ATE business fills our gap in sales and sales support. For a young company like us  with very innovative state of the art products, ATEip provides a solution to add sales power with no fix cost .
Marcus Verhoeven, Managing Director Aspect Systems Aspect Systems

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