Digital from 10Kbps to 3.2Gbps
High Fidelity Pin Electronic, PMU, dynamic Load, LVDS etc.
Currently 64Gb of memory for 32 channels
Quad samplers 16 bit @ 400MSps / 24 bit @ 200kSps
Multi power supply modules
UNIQUE HIGH POWER TEST SOLUTION
Static and dynamic wafer and final test, 10,000 V and 10,000 A ...
Unique PXI instruments, 19" VISM modules, 2D high end image processing for Zero Defect industrial applications
October 8-10, 2013 in Dresden ATEip at OSAI AUTOMATION SYSTEMS Booth 1472
What others have to say about us
Instant sales coverage on discretes static and dynamic test markets with strong customer relationship, network and background of ATE business fills our gap in sales and sales support. For a unique new product series like our MDT systems family, ATEip provides a solution to add sales power with no fix cost .
Mauro Serra, Project and Sales Manager CREA Test CREA Test