UNIQUE SCALABLE SOC TEST SOLUTION

Ultra compact, multi site, wafer and final test, 10GBit data transfer rate, smallest ATE module form factor, VHDL programming …

UNIQUE SCALABLE SOC TEST SOLUTION
UNIQUE BOARD REPAIR & DIAGNOSTIC TEST SOLUTION

UNIQUE BOARD REPAIR & DIAGNOSTIC TEST SOLUTION

Digital/analog/mixed signal, VHDL device library, guided Probe back-tracking, QSM-VI signature analysis, automatic fault simulation, circuit tracer …

HIGH PERFORMANCE FOR LOW BUDGET

HIGH PERFORMANCE FOR LOW BUDGET

Digital from 10Kbps to 3.2Gbps High Fidelity Pin Electronic, PMU, dynamic Load, LVDS etc. Currently 64Gb of memory for 32 channels Quad samplers 16 bit @ 400MSps / 24 bit @ 200kSps Multi power supply modules

UNIQUE HIGH POWER TEST SOLUTION

Static and dynamic wafer and final test, 10,000 V and 10,000 A ...

UNIQUE HIGH POWER TEST SOLUTION

ACCESSORIES PRODUCTS

Unique PXI instruments, 19" VISM modules, 2D high end image processing for Zero Defect industrial applications

ACCESSORIES PRODUCTS

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CitationInstant sales coverage on discretes static and dynamic test markets with strong customer relationship, network and background of ATE business fills our gap in sales and sales support. For a unique new product series like our MDT systems family, ATEip provides a solution to add sales power with no fix cost .
Mauro Serra, Project and Sales Manager CREA Test CREA Test

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